The use of partially recorded reflections for post refinement, scaling and averaging X-ray diffraction data
Beek, C. G. van,
Bolotovsky, R. and
Rossmann, M. G.,
International Tables for Crystallography
(2012).
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Anomalous dispersion
Beek, C. G. van,
Bolotovsky, R. and
Rossmann, M. G.,
International Tables for Crystallography
(2012).
Vol. F,
Section 11.5.7.6,
pp. 300-301
[ doi:10.1107/97809553602060000834 ]
[
more
results from section 11.5.7 in volume F]
Selection of reflections useful for scaling
Beek, C. G. van,
Bolotovsky, R. and
Rossmann, M. G.,
International Tables for Crystallography
(2012).
Vol. F,
Section 11.5.3,
pp. 297-297
[ doi:10.1107/97809553602060000834 ]
Estimating the quality of data scaling and averaging
Beek, C. G. van,
Bolotovsky, R. and
Rossmann, M. G.,
International Tables for Crystallography
(2012).
Vol. F,
Section 11.5.6,
pp. 298-298
[ doi:10.1107/97809553602060000834 ]
Restraints and constraints
Beek, C. G. van,
Bolotovsky, R. and
Rossmann, M. G.,
International Tables for Crystallography
(2012).
Vol. F,
Section 11.5.4,
pp. 297-298
[ doi:10.1107/97809553602060000834 ]
Conclusions
Beek, C. G. van,
Bolotovsky, R. and
Rossmann, M. G.,
International Tables for Crystallography
(2012).
Vol. F,
Section 11.5.8,
pp. 301-301
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Beek, C. G. van,
Bolotovsky, R. and
Rossmann, M. G.,
International Tables for Crystallography
(2012).
Vol. F,
Section 11.5.2,
pp. 296-297
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Introduction
Beek, C. G. van,
Bolotovsky, R. and
Rossmann, M. G.,
International Tables for Crystallography
(2012).
Vol. F,
Section 11.5.1,
pp. 296-296
[ doi:10.1107/97809553602060000834 ]
Generalization of the procedure for averaging reflection intensities
Beek, C. G. van,
Bolotovsky, R. and
Rossmann, M. G.,
International Tables for Crystallography
(2012).
Vol. F,
Section 11.5.5,
pp. 298-298
[ doi:10.1107/97809553602060000834 ]
